Buku Perpustakaan Pusat
Semiconductor memories: technology, testing, and reliabilty
The Institute of Electical and Electronics Engineers Inc · 1997
Deskripsi
Provides in depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods, including: memory cell structures and fabrication technologies; application specific memories and architectures; and memory design, fault modeling and test algorithms, limitations, and trade offs.
Subjek
No. panggil
621.397 32 SHA s
Detail
- Penerbit
- The Institute of Electical and Electronics Engineers Inc
- Tahun
- 1997
- ISBN
- 0-7803-1114-0
- Kolasi
- xii, 462 hal, ; bibl, ; ind, ; 25 cm
- Bahasa
- English
- Klasifikasi
- 621.397 32